Ting-Kuo Kang,: search on Z-Library

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1

Effect of silicon channel orientation on analog performance of (1 1 0) surface pMOSFETs

Journal:

Solid-State Electronics

Year:

2012

Language:

english

File:

PDF, 307 KB

english, 2012

2

Scale-Invariant Quantum Anomalous Hall Effect in Magnetic Topological Insulators beyond the Two-Dimensional Limit

Kou, Xufeng, Guo, Shih-Ting, Fan, Yabin, Pan, Lei, Lang, Murong, Jiang, Ying, Shao, Qiming, Nie, Tianxiao, Murata, Koichi, Tang, Jianshi, Wang, Yong, He, Liang, Lee, Ting-Kuo, Lee, Wei-Li, Wang, Kang

Journal:

Physical Review Letters

Year:

2014

Language:

english

File:

PDF, 554 KB

english, 2014

3

[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Low-voltage forward gated diode: an early monitor of hot-carrier degradations in scaled MOSFETs

Ming-Jer Chen,, Ting-Kuo Kang,

Year:

1999

Language:

english

File:

PDF, 419 KB

english, 1999

4

Tensile CESL-induced strain dependence on impact ionization efficiency in nMOSFETs

Bo-Chin Wang, Ting-Kuo Kang, San-Lein Wu, Shoou-Jinn Chang

Journal:

Microelectronics Reliability

Year:

2010

Language:

english

File:

PDF, 614 KB

english, 2010

5

Forward gated-diode measurement of filled traps in high-field stressed thin oxides

Ming-Jer Chen, Ting-Kuo Kang, Huan-Tsung Huang, Chuan-Hsi Liu, Chang, Y.J., Kuan-Yu Fu

Journal:

IEEE Transactions on Electron Devices

Year:

2000

Language:

english

File:

PDF, 112 KB

english, 2000

6

Oxide thinning percolation statistical model for soft breakdown in ultrathin gate oxides

Chen, Ming-Jer, Kang, Ting-Kuo, Liu, Chuan-Hsi, Chang, Yih J., Fu, Kuan-Yu

Journal:

Applied Physics Letters

Year:

2000

Language:

english

File:

PDF, 393 KB

english, 2000

7

Comprehensive Solution for Ultrathin Oxide Reliability Projections Including Novel Explanation for Power-Law Exponent Variations

Shieh, Jerry, Lin, Cheng-Li, Kang, Ting-Kuo, Lo, Oswin, Chen, Ju-Ping, Su, K. C.

Journal:

Japanese Journal of Applied Physics

Year:

2006

Language:

english

File:

PDF, 533 KB

english, 2006

8

Tris(pentafluorophenyl)borane as an Electrolyte Additive to Improve the High Temperature Cycling Performance of LiFePO[sub 4] Cathode

Chang, Chia-Chin, Chen, Te-Kang, Her, Li-Jane, Fey, George Ting-Kuo

Journal:

Journal of The Electrochemical Society

Year:

2009

Language:

english

File:

PDF, 293 KB

english, 2009

9

Numerical confirmation of inelastic trap-assisted tunneling (ITAT) as SILC mechanism

Ting-Kuo Kang, Ming-Jer Chen, Chuan-Hsi Liu, Chang, Y.J., Shou-Kong Fan

Journal:

IEEE Transactions on Electron Devices

Year:

2001

Language:

english

File:

PDF, 127 KB

english, 2001

10

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - A comprehensive solution for ultra-thin oxide reliability issue including a novel explanation of power-law exponent variations

Ting-Kuo Kang,, Jerry Shieh,, Oswin Lo,, Ju-Ping Chen,, Cheng-Li Lin,, Su, K.C.

Year:

2005

Language:

english

File:

PDF, 411 KB

english, 2005

11

Enhanced seebeck coefficient for a compressive n-type polysilicon film

Journal:

Solid-State Electronics

Year:

2014

Language:

english

File:

PDF, 796 KB

english, 2014

12

Tunable piezoresistive sensors based on pencil-on-paper

Journal:

Applied Physics Letters

Year:

2014

Language:

english

File:

PDF, 1.45 MB

english, 2014

13

The piezoresistive effect in n -type junctionless silicon nanowire transistors

Journal:

Year:

2012

Language:

english

File:

PDF, 907 KB

english, 2012

14

Physics of enhanced impact ionization in strained-Si p-channel metal-oxide-semiconductor field-effect transistors

Journal:

Applied Physics Letters

Year:

2008

Language:

english

File:

PDF, 538 KB

english, 2008

15

Study of Enhanced Impact Ionization in Strained-SiGe p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors

Huang, Po-Chin, Kang, Ting-Kuo, Wang, Bo-Chin, Wu, San-Lein, Chang, Shoou-Jinn

Journal:

Japanese Journal of Applied Physics

Year:

2009

Language:

english

File:

PDF, 255 KB

english, 2009

16

Highly Stretchable Non-volatile Nylon Thread Memory

Journal:

Scientific Reports

Year:

2016

Language:

english

File:

PDF, 1.10 MB

english, 2016

17

Evidence for giant piezoresistance effect in n-type silicon nanowire field-effect transistors

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 559 KB

english, 2012

18

Erratum: Scale-Invariant Quantum Anomalous Hall Effect in Magnetic Topological Insulators beyond the Two-Dimensional Limit [Phys. Rev. Lett. 113 , 137201 (2014)]

Kou, Xufeng, Guo, Shih-Ting, Fan, Yabin, Pan, Lei, Lang, Murong, Jiang, Ying, Shao, Qiming, Nie, Tianxiao, Murata, Koichi, Tang, Jianshi, Wang, Yong, He, Liang, Lee, Ting-Kuo, Lee, Wei-Li, Wang, Kang

Journal:

Physical Review Letters

Year:

2014

Language:

english

File:

PDF, 192 KB

english, 2014

19

A simple four-point-bending setup for measurement of mechanical stress on silicon field-effect transistors

Journal:

Year:

2011

Language:

english

File:

PDF, 491 KB

english, 2011

20

Journal:

IEEE Electron Device Letters

Year:

2012

Language:

english

File:

PDF, 277 KB

english, 2012

21

Evaluation of p-type polysilicon piezoresistance in a full-bridge circuit for surface stress sensors

Journal:

Year:

2015

Language:

english

File:

PDF, 1.40 MB

english, 2015

22

Piezoresistive Characteristics of Nylon Thread Resistive Memories for Wearable Strain Sensors

Journal:

Year:

2019

Language:

english

File:

PDF, 2.68 MB

english, 2019

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